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A new approach for two-terminal electronic memory devices - Storing information on silicon nanowires

机译:两端子电子存储设备的新方法-在硅纳米线上存储信息

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摘要

The work described in this paper focuses on the utilisation of silicon nanowires as the information storage element in flash-type memory devices. Silicon nanostructures have attracted attention due to interesting electrical and optical properties, and their potential integration into electronic devices. A detailed investigation of the suitability of silicon nanowires as the charge storage medium in two-terminal non-volatile memory devices are presented in this report. The deposition of the silicon nanostructures was carried out at low temperatures (less than 400 °C) using a previously developed a novel method within our research group. Two-terminal non-volatile (2TNV) memory devices and metal-insulator-semiconductor (MIS) structures containing the silicon nanowires were fabricated and an in-depth study of their characteristics was carried out using current-voltage and capacitancetechniques.
机译:本文描述的工作集中于利用硅纳米线作为闪存型存储设备中的信息存储元件。硅纳米结构由于有趣的电学和光学特性,以及它们潜在地集成到电子设备中而引起了关注。本报告详细介绍了硅纳米线作为电荷存储介质在两端非易失性存储设备中的适用性。硅纳米结构的沉积是在低温(低于400°C)下使用我们研究小组中以前开发的新方法进行的。制造了包含硅纳米线的两端非易失性(2TNV)存储设备和金属绝缘体半导体(MIS)结构,并使用电流-电压和电容技术对其特性进行了深入研究。

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